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Cheng, Zhi-Yuan
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Cheng, Zhi-Yuan
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Cheng, Zhi-Yuan
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Steady state drain current technique for generation and recombination lifetime measurement in the SOI MOSFET
by
Cheng
,
Zhi
-
Yuan
,
Ling, C.H.
Published 2014
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2
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias
by
Ang, Chew-Hoe
,
Ling, Chung-Ho
,
Cheng
,
Zhi
-
Yuan
,
Kim, Sun-Jung
,
Cho, Byung-Jin
Published 2014
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