Metal gate/High-K dielectric stack on Si cap/ultra-thin pure Ge epi/Si substrate

by Yeo, C.C., Lee, M.H., Liu, C.W., Choi, K.J., Lee, T.W., Cho, B.J.
Published 2014

Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si1-xGex/Si nMOSFETs with HfO2gate dielectric

by Yeo, C.C., Cho, B.J., Lee, M.H., Liu, C.W., Choi, K.J., Lee, T.W.
Published 2011

Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si 1-xGex/Si nMOSFETs with HfO2 gate dielectric

by Yeo, C.C., Cho, B.J., Lee, M.H., Liu, C.W., Choi, K.J., Lee, T.W.
Published 2014

Framingham risk score inadequately predicts cardiac risk in young patients presenting with a first myocardial infarction

by Lee, G.K.M., Lee, L.-C., Liu, C.W.Y., Lim, S.L., Shi, L.-M., Ong, H.-Y., Lim, Y.-T., Yeo, T.-C.
Published 2015

Electron mobility enhancement using ultrathin pure Ge on Si substrate

by Yeo, C.C., Cho, B.J., Gao, F., Lee, S.J., Lee, M.H., Yu, C.-Y., Liu, C.W., Tang, L.J., Lee, T.W.
Published 2014