Solid phase epitaxy of ultra-shallow Sn implanted Si observed using high-resolution Rutherford backscattering spectrometry

by Chan, T.K., Fang, F., Markwitz, A., Osipowicz, T.
Published 2014

Formation of nanoclusters with varying Pb/Se concentration and distribution after sequential Pb + and Se + ion implantation into SiO 2

by Markwitz, A., Carder, D.A., Hopf, T., Kennedy, J., Chan, T.K., Mücklich, A., Osipowicz, T.
Published 2014

Formation of nanoclusters with varying Pb/Se concentration and distribution after sequential Pb + and Se + ion implantation into SiO 2

by Markwitz, A., Carder, D.A., Hopf, T., Kennedy, J., Chan, T.K., Mücklich, A., Osipowicz, T.
Published 2014

Formation of nanoclusters with varying Pb/Se concentration and distribution after sequential Pb + and Se + ion implantation into SiO 2

by Markwitz, A., Carder, D.A., Hopf, T., Kennedy, J., Chan, T.K., Mücklich, A., Osipowicz, T.
Published 2014

Sub-micron channeling contrast microscopy on reactive ion etched deep Si microstructures

by Teo, E.J., Alkaisi, M., Bettiol, A.A., Osipowicz, T., Van Kan, J., Watt, F., Markwitz, A.
Published 2014

Structural and photoluminescence properties of Gd implanted ZnO single crystals

by Murmu, P.P., Mendelsberg, R.J., Kennedy, J., Carder, D.A., Ruck, B.J., Markwitz, A., Reeves, R.J., Malar, P., Osipowicz, T.
Published 2014