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Marriott, P.K.
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Marriott, P.K.
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Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
by
Jeynes, C.
,
Barradas, N.P.
,
Marriott
,
P.K
.
,
Boudreault, G.
,
Jenkin, M.
,
Wendler, E.
,
Webb, R.P.
Published 2014
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