Showing
1 - 3
results of
3
for search '
Mohd Jeffery Manaf,
'
Skip to content
AUNILO IRDS | AUNILO Institutional Repository Discovery Service
FAQs
|
Search Tips
|
Feedback
Your Account
Log Out
Login
Theme
Bootstrap
Aunilo
Language
English
中文（繁體）
اللغة العربية
Toggle navigation
Home
Search/Browse Options
Search History
Advanced Search
About
About AUNILO IRDS
Content Sources
Statistics
Technical Team
Disclaimer
Privacy & Security Policy
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Author
Mohd Jeffery Manaf,
Showing
1 - 3
results of
3
for search '
Mohd Jeffery Manaf,
'
, query time: 0.01s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
Characterization of alignment strategy to achieve a reliable alignment accuracy in advanced lithography
by
Normah Ahmad
,
Uda Hashim
,
Mohd
Jeffery
Manaf
,
Kadir Ibrahim Abdul Wahab
Published 2007
Get full text
Get full text
Get full text
Article
Save to List
Saved in:
2
Effect of alignment mark architecture on alignment signal behavior in advanced lithography
by
Normah, Ahmad
,
Uda, Hashim
,
Mohd
Jeffery
,
Manaf
,
Kader Ibrahim, Abdul Wahab
Published 2009
Get full text
Article
Save to List
Saved in:
3
Effect of alignment mark depth on alignment signal behavior in advanced lithography
by
Normah, Ahmad
,
Uda, Hashim
,
Mohd
Jeffery
,
Manaf
,
Kader Ibrahim, Abdul Wahab
Published 2017
Get full text
Article
Save to List
Saved in:
Search Tools:
Get RSS Feed
—
Email this Search
—
×
Loading...