Author Search Results

1

Intra-level dielectric reliability in deep sub-micron copper interconnects

Intra-level dielectric reliability in deep sub-micron copper interconnects

by NGWAN VOON CHENG
Published 2010

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Theses and Dissertations

2

Characterization of oxide interface charges in trench field stop IGBT

Characterization of oxide interface charges in trench field stop IGBT

by Sim, Zhi Lin, Chin, Wei Mien, Bong, Yi Xiang, Goh, David Eng Hui, Ngwan, Voon Cheng
Published 2024

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Conference or Workshop Item