Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubes

by Wong, W.K., Nojeh, A., Pease, R.F.W.
Published 2014

Secondary electron detection for distributed axis electron beam systems

by Tanimoto, S., Pickard, D.S., Kenney, C., Pease, R.F.W.
Published 2014

Demonstration of secondary electron detection using monolithic multi-channel electron detector

by Tanimoto, S., Pickard, D.S., Kenney, C., Hast, J., Pease, R.F.
Published 2014

Demonstration of secondary electron detection using monolithic multi-channel electron detector

by Tanimoto, S., Pickard, D.S., Kenney, C., Hasi, J., Pease, R.F.W.
Published 2014

Monolithic multichannel secondary electron detector for distributed axis electron beam lithography and inspection

by Pickard, D.S., Kenney, C., Tanimoto, S., Crane, T., Groves, T., Pease, R.F.W.
Published 2014

Transient temperature measurements of resist heating using nanothermocouples

by Chu, D., Wong, W.-K., Goodson, K.E., Pease, R.F.W.
Published 2014

Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes

by Nojeh, A., Wong, W.-K., Baum, A.W., Pease, R.F., Dai, H.
Published 2014

Preferential orientation effects in partial melt laser crystallization of silicon

by Witte, D.J., Masbou, M.P.A., Crnogorac, F., Pease, R.F.W., Pickard, D.S.
Published 2014