Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

by Mirsaidov, U., Timashev, S.F., Polyakov, Y.S., Misurkin, P.I., Musaev, I., Polyakov, S.V.
Published 2016

Interfacing single photons from dissimilar sources

by Polyakov, S.V., Muller, A., Ling, A., Borjemscaia, N., Flagg, E.B., Keuren, E.V., Migdall, A.L., Solomon, G.S.
Published 2014