Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

10.1039/c0an00498g

Saved in:
Bibliographic Details
Main Authors: Mirsaidov, U., Timashev, S.F., Polyakov, Y.S., Misurkin, P.I., Musaev, I., Polyakov, S.V.
Other Authors: BIOLOGICAL SCIENCES
Format: Article
Published: 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128708
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/128708

Similar Items