Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

10.1039/c0an00498g

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Bibliographic Details
Main Authors:	Mirsaidov, U., Timashev, S.F., Polyakov, Y.S., Misurkin, P.I., Musaev, I., Polyakov, S.V.
Other Authors:	BIOLOGICAL SCIENCES
Format:	Article
Published:	2016
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/128708
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1287082023-10-31T07:02:23Z Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy Mirsaidov, U. Timashev, S.F. Polyakov, Y.S. Misurkin, P.I. Musaev, I. Polyakov, S.V. BIOLOGICAL SCIENCES 10.1039/c0an00498g Analyst 136 3 570-576 ANALA 2016-10-19T08:44:17Z 2016-10-19T08:44:17Z 2011-02-07 Article Mirsaidov, U., Timashev, S.F., Polyakov, Y.S., Misurkin, P.I., Musaev, I., Polyakov, S.V. (2011-02-07). Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy. Analyst 136 (3) : 570-576. ScholarBank@NUS Repository. https://doi.org/10.1039/c0an00498g 00032654 http://scholarbank.nus.edu.sg/handle/10635/128708 000286326800023 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1039/c0an00498g
author2	BIOLOGICAL SCIENCES
author_facet	BIOLOGICAL SCIENCES Mirsaidov, U. Timashev, S.F. Polyakov, Y.S. Misurkin, P.I. Musaev, I. Polyakov, S.V.
format	Article
author	Mirsaidov, U. Timashev, S.F. Polyakov, Y.S. Misurkin, P.I. Musaev, I. Polyakov, S.V.
spellingShingle	Mirsaidov, U. Timashev, S.F. Polyakov, Y.S. Misurkin, P.I. Musaev, I. Polyakov, S.V. Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
author_sort	Mirsaidov, U.
title	Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
title_short	Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
title_full	Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
title_fullStr	Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
title_full_unstemmed	Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
title_sort	analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
publishDate	2016
url	http://scholarbank.nus.edu.sg/handle/10635/128708
_version_	1781790596658102272

Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

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