Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

10.1039/c0an00498g

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Bibliographic Details
Main Authors: Mirsaidov, U., Timashev, S.F., Polyakov, Y.S., Misurkin, P.I., Musaev, I., Polyakov, S.V.
Other Authors: BIOLOGICAL SCIENCES
Format: Article
Published: 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128708
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Institution: National University of Singapore
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Summary:10.1039/c0an00498g

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