High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

by Toh, S.L., Li, K., Ang, C.H., Er, E., Redkar, S., Loh, K.P., Boothroyd, C.B., Chan, L.
Published 2014

Evolutionary trade-offs at the Arabidopsis WRR4A resistance locus underpin alternate Albugo candida race recognition specificities

by Castel, Baptiste, Fairhead, Sebastian, Furzer, Oliver J., Redkar, Amey, Wang, Shanshan, Cevik, Volkan, Holub, Eric B., Jones, Jonathan D. G.
Published 2022