Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurements

by Chu, L.W., Pey, K.L., Chim, W.K., Loh, S.K., Er, E.
Published 2014

In silico prediction of the granzyme B degradome

by Wee, L.J.K, Er, E.P.S, Ng, L.F.P, Tong, J.C
Published 2020

Reduction of local mechanical stress in a transistor using Si 3N4/SiOxNy, contact ESL

by Toh, S.L., Loh, K.P., Boothroyd, C.B., Li, K., Ang, C.H., Er, E., Chan, L.
Published 2014

High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

by Toh, S.L., Li, K., Ang, C.H., Er, E., Redkar, S., Loh, K.P., Boothroyd, C.B., Chan, L.
Published 2014

Evaluation of the strain state in SiGe/Si heterostructures by high resolution X-ray diffraction and convergent beam electron diffraction

by Toh, S.L., Li, K., Ang, C.H., Rao, R., Er, E., Loh, K.P., Boothroyd, C.B., Chan, L.
Published 2014