Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurements

by Chu, L.W., Chim, W.K., Pey, K.L., See, A.
Published 2014

Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurements

by Chu, L.W., Pey, K.L., Chim, W.K., Loh, S.K., Er, E.
Published 2014

Combined low-frequency noise and resistance measurements for void extraction in deep-submicrometer interconnects

by Chu, L.W., Chim, W.K., Pey, K.L., Yeo, J.Y.K., Chan, L.
Published 2014

Souvenaid in the management of mild cognitive impairment: An expert consensus opinion

by Cummings, J., Passmore, P., McGuinness, B., Mok, V., Chen, C., Engelborghs, S., Woodward, M., Manzano, S., Garcia-Ribas, G., Cappa, S., Bertolucci, P., Chu, L.-W.
Published 2021