Influence of film thickness on the structural, electrical and photoluminescence properties of vacuum deposited Alq(3) thin films on c-silicon substrate

by Koay, J.Y., Sharif K., A.M., Rahman, S.A.
Published 2009

Highly reflective nc-Si:H/a-CNx:H multilayer films prepared by r.f. PECVD technique

by Ritikos, R., Goh, B.T., Sharif, K.A.M., Muhamad, M.R., Rahman, S.A.
Published 2009