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由 Dzelzainis, TWJ, Chalupsky, J, Fajardo, M, F??ustlin, R, Heimann, PA, Hajkova, V, Juha, L0, Jurek, M, Khattak, FY, Kozlova, M, Krzywinski, J, Lee, RW, Nagler, B, Nelson, AJ, Rosmej, FB, Soberierski, R, Toleikis, S, Tschentscher, T, Vinko, SM, Wark, JS, Whitcher, T, Riley, D
出版 2019
獲取全文出版 2019
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2
XUV emission from autoionizing hole states induced by intense XUV-FEL at intensities up to 1017W/cm2
由 Rosmej, FB, Galtier, E, Riley, D, Dzelzainis, T, Heinmann, P, Khattak, FY, Lee, RW, Nagler, B, Nelson, A, Tschentscher, T, Vinko, SM, Whitcher, T, Toleikis, S, F??ustlin, R, Soberierski, R, Juha, L, Fajardo, M, Wark, JS, Chalupsky, J, Hajkova, V, Krzywinski, J, Jurek, M, Kozlova, M
出版 2019
獲取全文出版 2019
Article