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Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET
by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin
Published 2017
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by Chong, E., Shen, L., Soon, C.Y., Ong, H.Y., Poh, K.K., Teo, S.G., Lee, C.-H., Low, A., Tan, H.C.
Published 2016
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by Soon, Y.Y., Zheng, H., Ho, S.Z., Koh, W.Y., Leong, C.N., Tey, J.C.S., Vellayappan, B., Yap, S.P., Tham, I.W.K., Fong, K.W.
Published 2020
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by Lee, C.-H., Low, A.F., Poh, K.-K., Omar, A.R., Yeo, T.-C., Yip, J., Teo, S.-G., Tan, H.-C., Tai, B.-C., Lim, G.-H., Soon, C.-Y.
Published 2011
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by Khai, L.W., Geok Ing, N., Fitzgerald, E.A., Soon Fatt, Y., Yue, W., Kwang Hong, L., Zhihong, L., Hanlin, X., Siau Ben, C., Eng Kian, K.L., Xing, Z., Tan, C.S.
Published 2021
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by Chung, B.K., Chan, En Ze, Thien, L.K., Chan, D. S. T., Khor, H. K., Shu, F.E.P., Ling, Hwei Sung, Chow, H.B., Jong, Sin Yen, Soon, S. Y., Koh, K.T., Cham, Y.L., Asri, Said, Fong, A.Y.Y., Ong, T.K.
Published 2022
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by Ou, K., Yu, K., Kesuma, D., Hooi, M., Huang, N., Chen, W., Lee, S.Y., Goh, X.P., Tan, L.K., Liu, J., Soon, S.Y., Rashid, S.B.A., Putti, T.C., Jikuya, H., Ichikawa, T., Nishimura, O., Salto-Tellez, M., Tan, P.
Published 2014
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