Author Search Results

1

Physical analysis on ultrathin gate dielectric breakdown using TEM

Physical analysis on ultrathin gate dielectric breakdown using TEM

by Tang, Lei Jun
Published 2008

Get full text

Theses and Dissertations

2

Study of the electrical and chemical properties of the multistep deposited and two-step (ultraviolet ozone cum rapid thermal) annealed HfO2 gate stack

Study of the electrical and chemical properties of the multistep deposited and two-step (ultraviolet ozone cum rapid thermal) annealed HfO2 gate stack

by Yew, Kwang Sing, Ang, Diing Shenp, Tang, Lei Jun, Pan, Jisheng
Published 2015

Get full text
Get full text

Article