Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

by Ho, Y.W., Ng, V., Choi, W.K., Ng, S.P., Osipowicz, T., Seng, H.L., Tjui, W.W., Li, K.
Published 2014