Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

10.1016/S1359-6462(01)00743-6

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Bibliographic Details
Main Authors: Ho, Y.W., Ng, V., Choi, W.K., Ng, S.P., Osipowicz, T., Seng, H.L., Tjui, W.W., Li, K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Germanium
Nanocrystal
Raman spectroscopy
Rutherford backscattering
Transmission electron microscopy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82035
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82035

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