Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM
10.1016/S1359-6462(01)00743-6
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Main Authors: | Ho, Y.W., Ng, V., Choi, W.K., Ng, S.P., Osipowicz, T., Seng, H.L., Tjui, W.W., Li, K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82035 |
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Institution: | National University of Singapore |
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