Factors affecting Ge nanocrystal size in co-sputtered Ge+SiO2 films

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Choi, W.K., Ng, V., Ho, Y.W., Chen, T.B., Ho, V.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83729
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Institution: National University of Singapore