The effect of film thickness on the C40 TiSi2 to C54 TiSi 2 transition temperature

by Tan, S.C., Liu, L., Zeng, Y.P., See, A., Shen, Z.X.
Published 2014

Pattern-induced ripple structures at silicon-oxide/silicon interface by excimer laser irradiation

by Chen, X.Y., Lu, Y.F., Cho, B.J., Zeng, Y.P., Zeng, J.N., Wu, Y.H.
Published 2014

Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon

by Zeng, Y.P., Lu, Y.F., Shen, Z.X., Sun, W.X., Yu, T., Liu, L., Zeng, J.N., Cho, B.J., Poon, C.H.
Published 2014