A FOUR-POINT PROBE METHOD BASED ON LOG112 AND C8051F006 SOCs FOR RESISTIVITY MEASUREMENT

• Main Author: EKAWITA (NIM: 20207013), RISKA
• Format: Theses
• Language: Indonesia
• Online Access: https://digilib.itb.ac.id/gdl/view/12583
• Institution: Institut Teknologi Bandung

Resistivity is one of important parameters in order to be known in designing a devices. One of methods that is often used in determining material resistivity is a four-point probe method. This method uses a four-probes with two outer probes as a current source and two other probes as voltmeter. A four-point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed in this thesis. The LOG112 SoC is a chip of current to voltage converter. The Silicon Laboratories C8051F006 SoC controls measurement system, which consists of a 12-bit ADC, a 12-bit DAC and LOG112. The resistivity meter was calibrated by the Fluke 45. Resistors and sheet materials were used to examine system. Injected current and measured voltage are sent to PC by communications RS232 and presented by Delphi 7. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. <br />