DESIGN AND DEVELOPMENT OF C-V METER BASED ON SoC 8051F006
A capacitance versus voltage (C-V) meter is a tool to obtain capacitance of a device as function of voltage applied to the device. Semiconductor properties that can be derived from C-V characteristic are minority carrier life, and the width of depletion layer. A C-V meter has been designed and devel...
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| Format: | Theses |
| Language: | Indonesia |
| Online Access: | https://digilib.itb.ac.id/gdl/view/12060 |
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| Institution: | Institut Teknologi Bandung |
| Language: | Indonesia |