DESIGN AND DEVELOPMENT OF C-V METER BASED ON SoC 8051F006

• Main Author: RAHMAWATI (NIM: 20207003), ENDAH
• Format: Theses
• Language: Indonesia
• Online Access: https://digilib.itb.ac.id/gdl/view/12060
• Institution: Institut Teknologi Bandung

A capacitance versus voltage (C-V) meter is a tool to obtain capacitance of a device as function of voltage applied to the device. Semiconductor properties that can be derived from C-V characteristic are minority carrier life, and the width of depletion layer. A C-V meter has been designed and developed by employing the feedback charge amplifier in obtaining a C-V characteristic. The developed C-V meter consists of (i) capacitance meter and signal conditioning, (ii) SoC C8051F006, (iii) DAC (digital to analog converter, (iv) ADC( analog to digital converter). A voltage source with a voltage step is applied to a device under test (DUT) and its capacitance, which is measured by a capacitance meter, is stored into a personal computer via an RS-232 serial communication. The DAC and ADC of C-V meter were tested by Fluke 45. The error of DAC is about 0.003volt and for ADC is about 0.016volt. The 1nF type MKT capacitor, 1N4002, 1N4148, and FR104 diodes were used as devices uder test in examiningthe developed C-V meter. <br />