STUDI PENGARUH TEMPERATUR PENUMBUHAN TERHADAP KUALITAS FILM TIPIS GAN DITUMBUHKAN DENGAN TEKNIK PULSED LASER DEPOSITION

<p>Abstract:<p align="justify"> <br /> GaN thin film has been grown on sapphire (0001) substrate using a pulsed laser deposition technique. The N2 gass with 100 sccm flow rate, is used to keep the thin film stoichiometric. The growth temperature was varied from 650°C, 6...

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Bibliographic Details
Main Author: Widiyandari, Hendri
Format: Theses
Language:Indonesia
Online Access:https://digilib.itb.ac.id/gdl/view/5253
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Institution: Institut Teknologi Bandung
Language: Indonesia
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Summary:<p>Abstract:<p align="justify"> <br /> GaN thin film has been grown on sapphire (0001) substrate using a pulsed laser deposition technique. The N2 gass with 100 sccm flow rate, is used to keep the thin film stoichiometric. The growth temperature was varied from 650°C, 680°C to 700°C. GaN film was analized by mean of Profilometer Dektak 11A, X-Ray Difractometer and Scanning Electron Microscopy.<p align="justify"> The thin film prodused gave single crystalline with orientation (0002) a id (0004) that shown the wurtzite structure. For film grown at 680°C, we obtained an FWHM of 0,4°. The surface morphology showed film growning as isolated islands. <br /> <br /> <br /> Keywords : Gallium nitride, Pulsed Laser Deposition, FWHM, Morphology..