Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers

A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to...

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Main Authors: Mohamed, Mohd Ambri, Lam, Pham Tien, Otsuka, N.
Format: Article
Language:English
Published: Elsevier 2013
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Online Access:http://irep.iium.edu.my/29881/1/journal_of_crystal_growth.pdf
http://irep.iium.edu.my/29881/
http://dx.doi.org/10.1016/j.jcrysgro.2012.12.070
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Institution: Universiti Islam Antarabangsa Malaysia
Language: English
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spelling my.iium.irep.298812013-07-29T01:49:38Z http://irep.iium.edu.my/29881/ Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers Mohamed, Mohd Ambri Lam, Pham Tien Otsuka, N. QC Physics QD Chemistry TK7885 Computer engineering A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to a lattice strain which results in elastic interactions among AsGa defects. A change in magnetizations is induced by large lattice distortions during transition of AsGa defects from substitutional sites to interstitial sites. The calculation of electron states of an AsGa atom with a shallow acceptor Be atom show that at the transition, an AsGa+ ion is displaced to the interstitial site and becomes a neutral atom, leading to a magnetization annihilation. Elsevier 2013-01-04 Article REM application/pdf en http://irep.iium.edu.my/29881/1/journal_of_crystal_growth.pdf Mohamed, Mohd Ambri and Lam, Pham Tien and Otsuka, N. (2013) Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers. Journal of Crystal Growth, 378. pp. 329-332. ISSN 0022-0248 (In Press) http://dx.doi.org/10.1016/j.jcrysgro.2012.12.070 10.1016/j.jcrysgro.2012.12.070
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic QC Physics
QD Chemistry
TK7885 Computer engineering
spellingShingle QC Physics
QD Chemistry
TK7885 Computer engineering
Mohamed, Mohd Ambri
Lam, Pham Tien
Otsuka, N.
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
description A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to a lattice strain which results in elastic interactions among AsGa defects. A change in magnetizations is induced by large lattice distortions during transition of AsGa defects from substitutional sites to interstitial sites. The calculation of electron states of an AsGa atom with a shallow acceptor Be atom show that at the transition, an AsGa+ ion is displaced to the interstitial site and becomes a neutral atom, leading to a magnetization annihilation.
format Article
author Mohamed, Mohd Ambri
Lam, Pham Tien
Otsuka, N.
author_facet Mohamed, Mohd Ambri
Lam, Pham Tien
Otsuka, N.
author_sort Mohamed, Mohd Ambri
title Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
title_short Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
title_full Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
title_fullStr Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
title_full_unstemmed Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
title_sort origin of cooperative transition of antisite-arsenic defects in be-doped low-temperature-grown gaas layers
publisher Elsevier
publishDate 2013
url http://irep.iium.edu.my/29881/1/journal_of_crystal_growth.pdf
http://irep.iium.edu.my/29881/
http://dx.doi.org/10.1016/j.jcrysgro.2012.12.070
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