Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers
A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to...
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my.iium.irep.298812013-07-29T01:49:38Z http://irep.iium.edu.my/29881/ Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers Mohamed, Mohd Ambri Lam, Pham Tien Otsuka, N. QC Physics QD Chemistry TK7885 Computer engineering A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to a lattice strain which results in elastic interactions among AsGa defects. A change in magnetizations is induced by large lattice distortions during transition of AsGa defects from substitutional sites to interstitial sites. The calculation of electron states of an AsGa atom with a shallow acceptor Be atom show that at the transition, an AsGa+ ion is displaced to the interstitial site and becomes a neutral atom, leading to a magnetization annihilation. Elsevier 2013-01-04 Article REM application/pdf en http://irep.iium.edu.my/29881/1/journal_of_crystal_growth.pdf Mohamed, Mohd Ambri and Lam, Pham Tien and Otsuka, N. (2013) Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers. Journal of Crystal Growth, 378. pp. 329-332. ISSN 0022-0248 (In Press) http://dx.doi.org/10.1016/j.jcrysgro.2012.12.070 10.1016/j.jcrysgro.2012.12.070 |
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QC Physics QD Chemistry TK7885 Computer engineering Mohamed, Mohd Ambri Lam, Pham Tien Otsuka, N. Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
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A cooperative transition of antisite As (AsGa) defects in Be-doped low-temperature grown GaAs layers was studied by comparing magnetization of samples with different AsGa+ ions concentrations. With the aid of first principle calculations, the origin of cooperative transitions was shown to be due to a lattice strain which results in elastic interactions among AsGa defects. A change in magnetizations is induced by large lattice distortions during transition of AsGa defects from substitutional sites to interstitial sites. The calculation of electron states of an AsGa atom with a shallow acceptor Be atom show that at the transition, an AsGa+ ion is displaced to the interstitial site and becomes a neutral atom, leading to a magnetization annihilation. |
format |
Article |
author |
Mohamed, Mohd Ambri Lam, Pham Tien Otsuka, N. |
author_facet |
Mohamed, Mohd Ambri Lam, Pham Tien Otsuka, N. |
author_sort |
Mohamed, Mohd Ambri |
title |
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
title_short |
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
title_full |
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
title_fullStr |
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
title_full_unstemmed |
Origin of cooperative transition of antisite-Arsenic defects in Be-doped low-temperature-grown GaAs layers |
title_sort |
origin of cooperative transition of antisite-arsenic defects in be-doped low-temperature-grown gaas layers |
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Elsevier |
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2013 |
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http://irep.iium.edu.my/29881/1/journal_of_crystal_growth.pdf http://irep.iium.edu.my/29881/ http://dx.doi.org/10.1016/j.jcrysgro.2012.12.070 |
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