Tracking control of a nanopositioner using complementary sensors

Piezoelectric tube actuators are widely used in atomic force and scanning tunneling microscopy (STM) for nanoscale positioning. There has been a consistent effort to increase the scan speed of these actuators using feedback control techniques. A feedback controller requires a measurement of the scan...

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Main Authors: Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza, Liu, Kexiu
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE) 2009
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Online Access:http://irep.iium.edu.my/5210/1/Tracking_Control_of_a_Nanopositioner_Using_Complementary_Sensors.pdf
http://irep.iium.edu.my/5210/
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729
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Institution: Universiti Islam Antarabangsa Malaysia
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spelling my.iium.irep.52102012-02-10T02:38:51Z http://irep.iium.edu.my/5210/ Tracking control of a nanopositioner using complementary sensors Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Liu, Kexiu Q Science (General) TJ212 Control engineering Piezoelectric tube actuators are widely used in atomic force and scanning tunneling microscopy (STM) for nanoscale positioning. There has been a consistent effort to increase the scan speed of these actuators using feedback control techniques. A feedback controller requires a measurement of the scanner's deflection, which is often provided by a capacitive sensor. Such measurements are corrupted by sensor noise, typically in the order of 20 pm/ radicHz rms. Over a bandwidth of 10 kHz, this translates into an rms noise of 2 nm, clearly inadequate for applications that require subnanometer positioning accuracy, e.g., STM. In this paper, we illustrate how the strain voltage induced in a free electrode of the scanner can be used as an additional displacement signal. The noise level corresponding to the strain signal is about three orders of magnitude less than that of a capacitive sensor, making it an ideal choice for nanopositioning applications. However, it cannot be used for dc and low-frequency measurements. A two-sensor-based controller is designed to use the capacitive sensor signal at low frequencies, and the strain displacement signal at high frequencies. By limiting the capacitive sensor feedback loop bandwidth to less than 100 Hz, the rms value of the noise is reduced to well below 1 nm. For almost the same noise level, the two-sensor-based control structure achieves a closed-loop bandwidth of more than three times that of the single-sensor-based controller. Institute of Electrical and Electronics Engineers (IEEE) 2009-01 Article REM application/pdf en http://irep.iium.edu.my/5210/1/Tracking_Control_of_a_Nanopositioner_Using_Complementary_Sensors.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza and Liu, Kexiu (2009) Tracking control of a nanopositioner using complementary sensors. IEEE Transactions on Nanotechnology, 8 (1). pp. 55-65. ISSN 1536-125X http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729 10.1109/TNANO.2008.2005183
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic Q Science (General)
TJ212 Control engineering
spellingShingle Q Science (General)
TJ212 Control engineering
Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
Liu, Kexiu
Tracking control of a nanopositioner using complementary sensors
description Piezoelectric tube actuators are widely used in atomic force and scanning tunneling microscopy (STM) for nanoscale positioning. There has been a consistent effort to increase the scan speed of these actuators using feedback control techniques. A feedback controller requires a measurement of the scanner's deflection, which is often provided by a capacitive sensor. Such measurements are corrupted by sensor noise, typically in the order of 20 pm/ radicHz rms. Over a bandwidth of 10 kHz, this translates into an rms noise of 2 nm, clearly inadequate for applications that require subnanometer positioning accuracy, e.g., STM. In this paper, we illustrate how the strain voltage induced in a free electrode of the scanner can be used as an additional displacement signal. The noise level corresponding to the strain signal is about three orders of magnitude less than that of a capacitive sensor, making it an ideal choice for nanopositioning applications. However, it cannot be used for dc and low-frequency measurements. A two-sensor-based controller is designed to use the capacitive sensor signal at low frequencies, and the strain displacement signal at high frequencies. By limiting the capacitive sensor feedback loop bandwidth to less than 100 Hz, the rms value of the noise is reduced to well below 1 nm. For almost the same noise level, the two-sensor-based control structure achieves a closed-loop bandwidth of more than three times that of the single-sensor-based controller.
format Article
author Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
Liu, Kexiu
author_facet Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
Liu, Kexiu
author_sort Mahmood, Iskandar Al-Thani
title Tracking control of a nanopositioner using complementary sensors
title_short Tracking control of a nanopositioner using complementary sensors
title_full Tracking control of a nanopositioner using complementary sensors
title_fullStr Tracking control of a nanopositioner using complementary sensors
title_full_unstemmed Tracking control of a nanopositioner using complementary sensors
title_sort tracking control of a nanopositioner using complementary sensors
publisher Institute of Electrical and Electronics Engineers (IEEE)
publishDate 2009
url http://irep.iium.edu.my/5210/1/Tracking_Control_of_a_Nanopositioner_Using_Complementary_Sensors.pdf
http://irep.iium.edu.my/5210/
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729
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