Investigation of latch-up behaviour in 0.5 micron CMOS technology / Wan Fazldia Hanim, Suhana Sulaiman and Jamil Napiah

The research project investigates available latch-up test structures from MIMOS Berhad and covers current-voltage characterization of silicon-controlled rectifier behaviour of parasitic BJTs in CMOS technology. Measurement setup utilizing the structures for IV measurements are designed. A suitable m...

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Bibliographic Details
Main Authors: Hanim, Wan Fazldia, Sulaiman, Suhana, Napiah, Jamil
Format: Research Reports
Language:English
Published: 2005
Subjects:
Online Access:https://ir.uitm.edu.my/id/eprint/48264/1/48264.pdf
https://ir.uitm.edu.my/id/eprint/48264/
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Institution: Universiti Teknologi Mara
Language: English

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