Model selection based on value-at-risk backtests approach for GARCH-type models

This paper aims to investigate the efficiency of the value-at-risk (VaR) backtests in the model selection from different types of generalised autoregressive conditional heteroskedasticity (GARCH) models with skewed and non-skewed innovation distributions. Extensive simulation is carried out to compa...

Full description

Saved in:
Bibliographic Details
Main Author: Koh, You Beng
Format: Conference or Workshop Item
Language:English
Published: 2019
Subjects:
Online Access:http://eprints.um.edu.my/22371/1/koh%20you%20beng.pdf
http://eprints.um.edu.my/22371/
http://www.isi2019.org/
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Malaya
Language: English
id my.um.eprints.22371
record_format eprints
spelling my.um.eprints.223712019-12-16T05:44:45Z http://eprints.um.edu.my/22371/ Model selection based on value-at-risk backtests approach for GARCH-type models Koh, You Beng Q Science (General) QA Mathematics This paper aims to investigate the efficiency of the value-at-risk (VaR) backtests in the model selection from different types of generalised autoregressive conditional heteroskedasticity (GARCH) models with skewed and non-skewed innovation distributions. Extensive simulation is carried out to compare the model selection based on VaR backtests and Akaike Information Criteria (AIC). When the model is given but the innovation distribution is one of the six selected distributions which may be skewed or non-skewed, the simulation results show that both AIC and the VaR backtests succeed in selecting the correct innovation distribution from the set of six distributions under consideration. This indicates that both AIC and the VaR backtests are able to distinguish between skewed and non-skewed distributions when the innovation distribution is misspecified. Using an empirical data from NASDAQ index, we observe that the selected combination of model and innovation distribution based on the smallest AIC does not agree with that selected by using the in-sample VaR backtests. Examination of confidence limits for VaR and the expected shortfall forecasts under various loss functions provides evidence that the selected combination of model and innovation distribution using the VaR backtests tends to possess smaller mean absolute percentage error and logarithmic loss. 2019 Conference or Workshop Item PeerReviewed text en http://eprints.um.edu.my/22371/1/koh%20you%20beng.pdf Koh, You Beng (2019) Model selection based on value-at-risk backtests approach for GARCH-type models. In: 62nd ISI World Statistics Congress 2019, 18-23 August 2019, KLCC, Kuala Lumpur, Malaysia. http://www.isi2019.org/
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
language English
topic Q Science (General)
QA Mathematics
spellingShingle Q Science (General)
QA Mathematics
Koh, You Beng
Model selection based on value-at-risk backtests approach for GARCH-type models
description This paper aims to investigate the efficiency of the value-at-risk (VaR) backtests in the model selection from different types of generalised autoregressive conditional heteroskedasticity (GARCH) models with skewed and non-skewed innovation distributions. Extensive simulation is carried out to compare the model selection based on VaR backtests and Akaike Information Criteria (AIC). When the model is given but the innovation distribution is one of the six selected distributions which may be skewed or non-skewed, the simulation results show that both AIC and the VaR backtests succeed in selecting the correct innovation distribution from the set of six distributions under consideration. This indicates that both AIC and the VaR backtests are able to distinguish between skewed and non-skewed distributions when the innovation distribution is misspecified. Using an empirical data from NASDAQ index, we observe that the selected combination of model and innovation distribution based on the smallest AIC does not agree with that selected by using the in-sample VaR backtests. Examination of confidence limits for VaR and the expected shortfall forecasts under various loss functions provides evidence that the selected combination of model and innovation distribution using the VaR backtests tends to possess smaller mean absolute percentage error and logarithmic loss.
format Conference or Workshop Item
author Koh, You Beng
author_facet Koh, You Beng
author_sort Koh, You Beng
title Model selection based on value-at-risk backtests approach for GARCH-type models
title_short Model selection based on value-at-risk backtests approach for GARCH-type models
title_full Model selection based on value-at-risk backtests approach for GARCH-type models
title_fullStr Model selection based on value-at-risk backtests approach for GARCH-type models
title_full_unstemmed Model selection based on value-at-risk backtests approach for GARCH-type models
title_sort model selection based on value-at-risk backtests approach for garch-type models
publishDate 2019
url http://eprints.um.edu.my/22371/1/koh%20you%20beng.pdf
http://eprints.um.edu.my/22371/
http://www.isi2019.org/
_version_ 1654960696860868608