Temperature and energy dependence of diffusion in Solid - Effect of Diffusion Coefficient and Junction Depth

Temperature and energy dependence of diffusion in Solid - Effect of Diffusion Coefficient and Junction Depth

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Bibliographic Details
Main Author: Nur Ruzana Bohari
Other Authors: Mohd Hafiz Ismail (Advisor)
Format: Learning Object
Language:English
Published: Universiti Malaysia Perlis 2008
Subjects:
Diffusion
Semiconductors
Negative metal oxide semiconductors (NMOS)
Integrated circuits
Silicon
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/1991
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Institution: Universiti Malaysia Perlis
Language: English

Internet

http://dspace.unimap.edu.my/xmlui/handle/123456789/1991

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