Temperature and energy dependence of diffusion in Solid - Effect of Diffusion Coefficient and Junction Depth

Access is limited to UniMAP community.

Saved in:

Bibliographic Details
Main Author:	Nur Ruzana Bohari
Other Authors:	Mohd Hafiz Ismail (Advisor)
Format:	Learning Object
Language:	English
Published:	Universiti Malaysia Perlis 2008
Subjects:	Diffusion Semiconductors Negative metal oxide semiconductors (NMOS) Integrated circuits Silicon
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/1991
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Universiti Malaysia Perlis
Language:	English

Similar Items