Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review
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2014
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my.unimap-355232014-06-15T13:47:52Z Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review Louis, Gerrer Ding, J. Amoroso, S. M. Adamu-Lema, F. R., Hussin Reid, D. Millar, C. Asenov, A. louis.gerrer@glasgow.ac.uk MOSFETs Statistical Variability (SV) Link to publisher's homepage at http://www.journals.elsevier.com In this paper we summarize the impact of Statistical Variability (SV) on device performances and study the impact of oxide trapped charges in combination with SV. Traps time constants are described and analysed in combination with SV and time dependent simulations are performed including SV, random traps and charge injection stochasticity. Finally we demonstrate the necessity of statistical simulations in extracting compact models of aged devices and we address the problem of aged SRAM cell reliability. 2014-06-15T13:47:52Z 2014-06-15T13:47:52Z 2014-04 Article Microelectronics Reliability, vol.54 (4), 2014, pages 682–697 0026-2714 http://dspace.unimap.edu.my:80/dspace/handle/123456789/35523 http://www.sciencedirect.com/science/article/pii/S0026271414000420 10.1016/j.microrel.2014.01.024 en Elsevier |
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Universiti Malaysia Perlis |
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Asia |
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Malaysia |
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Universiti Malaysia Perlis |
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| language |
English |
| topic |
MOSFETs Statistical Variability (SV) |
| spellingShingle |
MOSFETs Statistical Variability (SV) Louis, Gerrer Ding, J. Amoroso, S. M. Adamu-Lema, F. R., Hussin Reid, D. Millar, C. Asenov, A. Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| description |
Link to publisher's homepage at http://www.journals.elsevier.com |
| author2 |
louis.gerrer@glasgow.ac.uk |
| author_facet |
louis.gerrer@glasgow.ac.uk Louis, Gerrer Ding, J. Amoroso, S. M. Adamu-Lema, F. R., Hussin Reid, D. Millar, C. Asenov, A. |
| format |
Article |
| author |
Louis, Gerrer Ding, J. Amoroso, S. M. Adamu-Lema, F. R., Hussin Reid, D. Millar, C. Asenov, A. |
| author_sort |
Louis, Gerrer |
| title |
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| title_short |
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| title_full |
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| title_fullStr |
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| title_full_unstemmed |
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review |
| title_sort |
modelling rtn and bti in nanoscale mosfets from device to circuit: a review |
| publisher |
Elsevier |
| publishDate |
2014 |
| url |
http://dspace.unimap.edu.my:80/dspace/handle/123456789/35523 |
| _version_ |
1643797831226490880 |