Analysis of reliability for fault tolerant design in NANO CMOS logic circuit

Analysis of reliability for fault tolerant design in NANO CMOS logic circuit

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Bibliographic Details
Main Authors: Manimekalai, D., Pradipkumar, D.
Other Authors: manimekalai7@gmail.com
Format: Article
Language:English
Published: Universiti Malaysia Perlis (UniMAP) 2017
Subjects:
Nano CMOS
Fault
Reliability
Online Access:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/49945
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Institution: Universiti Malaysia Perlis
Language: English

Internet

http://dspace.unimap.edu.my:80/xmlui/handle/123456789/49945

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