Man-2403 resist development for electron beam lithography process
Malaysian Technical Universities Conference on Engineering and Technology organized by Universiti Malaysia Pahang in collaboration with Universiti Tun Hussein Onn Malaysia, Universiti Teknikal Malaysia Melaka & Universiti Malaysia Perlis on June 20th - 22nd, 2009, at MS Garden Hotel, Kuantan, P...
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Universiti Malaysia Pahang
2010
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my.unimap-86462010-08-13T04:50:02Z Man-2403 resist development for electron beam lithography process Nur Hamidah, Abdul Halim Uda, Hashim, Prof. Dr. Mohammad Nuzaihan, Md Nor E-beam lithography Resist development maN-2403 Malaysian Technical Universities Conference on Engineering and Technology (MUCEET) Malaysian Technical Universities Conference on Engineering and Technology organized by Universiti Malaysia Pahang in collaboration with Universiti Tun Hussein Onn Malaysia, Universiti Teknikal Malaysia Melaka & Universiti Malaysia Perlis on June 20th - 22nd, 2009, at MS Garden Hotel, Kuantan, Pahang, Malaysia. Line-width of resist patterns is more susceptible to the developing time than the thickness of the undeveloped resist. This project focused on the development of MaN-2403 resist for e-beam lithography process. The objective of this project is to observe the effect of exposure dose and development time to the physical structure of maN-2403 resist using scanning electron microscope (SEM) and atomic force microscopy (AFM). The incomplete development of exposed resist pattern caused bridging effect in ma-N2403 resist tone. 2010-08-13T04:50:02Z 2010-08-13T04:50:02Z 2009-06-20 Working Paper http://hdl.handle.net/123456789/8646 en Proceedings of the Malaysian Technical Universities Conference on Engineering and Technology (MUCEET) 2009 Universiti Malaysia Pahang |
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E-beam lithography Resist development maN-2403 Malaysian Technical Universities Conference on Engineering and Technology (MUCEET) |
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E-beam lithography Resist development maN-2403 Malaysian Technical Universities Conference on Engineering and Technology (MUCEET) Nur Hamidah, Abdul Halim Uda, Hashim, Prof. Dr. Mohammad Nuzaihan, Md Nor Man-2403 resist development for electron beam lithography process |
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Malaysian Technical Universities Conference on Engineering and Technology organized by Universiti Malaysia Pahang in collaboration with Universiti Tun Hussein Onn Malaysia, Universiti Teknikal Malaysia Melaka & Universiti Malaysia Perlis on
June 20th - 22nd, 2009, at MS Garden Hotel, Kuantan, Pahang, Malaysia. |
format |
Working Paper |
author |
Nur Hamidah, Abdul Halim Uda, Hashim, Prof. Dr. Mohammad Nuzaihan, Md Nor |
author_facet |
Nur Hamidah, Abdul Halim Uda, Hashim, Prof. Dr. Mohammad Nuzaihan, Md Nor |
author_sort |
Nur Hamidah, Abdul Halim |
title |
Man-2403 resist development for electron beam lithography process |
title_short |
Man-2403 resist development for electron beam lithography process |
title_full |
Man-2403 resist development for electron beam lithography process |
title_fullStr |
Man-2403 resist development for electron beam lithography process |
title_full_unstemmed |
Man-2403 resist development for electron beam lithography process |
title_sort |
man-2403 resist development for electron beam lithography process |
publisher |
Universiti Malaysia Pahang |
publishDate |
2010 |
url |
http://dspace.unimap.edu.my/xmlui/handle/123456789/8646 |
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1643789245706403840 |