Process Parameters Optimization of 14nm MOSFET Using 2-D Analytical Modelling
Hafnium oxides; High-k dielectric; Manufacture; Silicides; Taguchi methods; CMOS transistors; HIGH-K metal gates; Modeling and optimization; Process parameters; Process parameters optimizations; Titanium silicide; Tungsten silicide; Wafer fabrications; Reconfigurable hardware
Saved in:
Main Authors: | , , , , , , |
---|---|
Other Authors: | |
Format: | Conference Paper |
Published: |
EDP Sciences
2023
|
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Universiti Tenaga Nasional |
Be the first to leave a comment!