Microstructural evolution of oxygen incorporated CdTe thin films deposited by close-spaced sublimation
Annealing; Argon; Cadmium telluride; Carrier concentration; Energy gap; Grain size and shape; II-VI semiconductors; Morphology; Optical properties; Oxygen; Scanning electron microscopy; Sublimation; Surface morphology; Thin films; X ray diffraction; Argon ambient; Argon/O2 ambient; Cadmium telluride...
Saved in:
| Main Authors: | , , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
Elsevier B.V.
2023
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Universiti Tenaga Nasional |