Technique to improve visibility for cycle time improvement in semiconductor manufacturing

Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-pr...

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Main Authors: Rahim S.R.A., Ahmad I., Chik M.A.
Other Authors: 55602785200
Format: Conference paper
Published: 2023
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spelling my.uniten.dspace-294852023-12-28T14:30:13Z Technique to improve visibility for cycle time improvement in semiconductor manufacturing Rahim S.R.A. Ahmad I. Chik M.A. 55602785200 12792216600 24775125500 Advance Productivity Family (APF) Manufacturing Execution Systems (MES) Work In progress (WIP) Automation Benchmarking Data acquisition Data transfer Manufacture Productivity Advance Productivity Family (APF) Automated data Automated systems Customer trust Cycle time Cycle time improvements Cycle time reduction Data collection Key performance indicators Manual work Manufacturing environments Manufacturing Execution System Product time Real problems Real roots Real situation Real time data collections Semi-conductor fabrication Semiconductor manufacturing Work in progress Semiconductor device manufacture Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39% reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction. � 2012 IEEE. Final 2023-12-28T06:30:13Z 2023-12-28T06:30:13Z 2012 Conference paper 10.1109/SMElec.2012.6417223 2-s2.0-84874173037 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84874173037&doi=10.1109%2fSMElec.2012.6417223&partnerID=40&md5=4422759caff58bf709c7d003661028c2 https://irepository.uniten.edu.my/handle/123456789/29485 6417223 627 630 Scopus
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
topic Advance Productivity Family (APF)
Manufacturing Execution Systems (MES)
Work In progress (WIP)
Automation
Benchmarking
Data acquisition
Data transfer
Manufacture
Productivity
Advance Productivity Family (APF)
Automated data
Automated systems
Customer trust
Cycle time
Cycle time improvements
Cycle time reduction
Data collection
Key performance indicators
Manual work
Manufacturing environments
Manufacturing Execution System
Product time
Real problems
Real roots
Real situation
Real time data collections
Semi-conductor fabrication
Semiconductor manufacturing
Work in progress
Semiconductor device manufacture
spellingShingle Advance Productivity Family (APF)
Manufacturing Execution Systems (MES)
Work In progress (WIP)
Automation
Benchmarking
Data acquisition
Data transfer
Manufacture
Productivity
Advance Productivity Family (APF)
Automated data
Automated systems
Customer trust
Cycle time
Cycle time improvements
Cycle time reduction
Data collection
Key performance indicators
Manual work
Manufacturing environments
Manufacturing Execution System
Product time
Real problems
Real roots
Real situation
Real time data collections
Semi-conductor fabrication
Semiconductor manufacturing
Work in progress
Semiconductor device manufacture
Rahim S.R.A.
Ahmad I.
Chik M.A.
Technique to improve visibility for cycle time improvement in semiconductor manufacturing
description Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39% reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction. � 2012 IEEE.
author2 55602785200
author_facet 55602785200
Rahim S.R.A.
Ahmad I.
Chik M.A.
format Conference paper
author Rahim S.R.A.
Ahmad I.
Chik M.A.
author_sort Rahim S.R.A.
title Technique to improve visibility for cycle time improvement in semiconductor manufacturing
title_short Technique to improve visibility for cycle time improvement in semiconductor manufacturing
title_full Technique to improve visibility for cycle time improvement in semiconductor manufacturing
title_fullStr Technique to improve visibility for cycle time improvement in semiconductor manufacturing
title_full_unstemmed Technique to improve visibility for cycle time improvement in semiconductor manufacturing
title_sort technique to improve visibility for cycle time improvement in semiconductor manufacturing
publishDate 2023
_version_ 1806425757750132736