Technique to improve visibility for cycle time improvement in semiconductor manufacturing

• Main Authors: Rahim S.R.A., Ahmad I., Chik M.A.
• Other Authors: 55602785200
• Format: Conference paper
• Published: 2023
• Subjects: Advance Productivity Family (APF); Manufacturing Execution Systems (MES); Work In progress (WIP); Automation; Benchmarking; Data acquisition; Data transfer; Manufacture; Productivity; Automated data; Automated systems; Customer trust; Cycle time; Cycle time improvements; Cycle time reduction; Data collection; Key performance indicators; Manual work; Manufacturing environments; Manufacturing Execution System; Product time; Real problems; Real roots; Real situation; Real time data collections; Semi-conductor fabrication; Semiconductor manufacturing; Work in progress; Semiconductor device manufacture
• Institution: Universiti Tenaga Nasional

Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-pr...