PREDICTIVE ANALYTICS OF JUNCTIONLESS DOUBLE GATE STRAINED MOSFET USING GENETIC ALGORITHM WITH DOE-BASED GREY RELATIONAL ANALYSIS

This paper explores the application of Genetic Algorithm (GA) incorporated with design of experiment (DoE) based on Grey Relational Analysis (GRA) in predicting the optimal design parameters of n-type Junctionless Double Gate Strained MOSFET (JLDGSM). The GRA is applied to predict the optimum level...

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Bibliographic Details
Main Authors: Kaharudin K.E., Salehuddin F., Jalaludin N.A., Arith F., Zain A.S.M., Ahmad I., Junos S.A.M.
Other Authors: 56472706900
Format: Article
Published: Taylor's University 2024
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Institution: Universiti Tenaga Nasional