Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application

In semiconductor packaging, wire bonds have been an important interconnect, and over the years, the use of other wire bonds other than Gold (Au) such as Silver (Ag) and Copper (Cu) wires has started, driven by the lower cost offered. Unfortunately, these bonding wires cannot surpass the superior pro...

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Main Authors: Palagud, Jose, Lim, T.S., Jasmee, Solehah, Masdzarif, Nur Diana Izzani, Wang, S.W., Hoo, K.I., Omar, Ghazali
Format: Conference or Workshop Item
Language:English
Published: 2023
Online Access:http://eprints.utem.edu.my/id/eprint/28007/1/Analysis%20on%20bonding%20wires%20of%20Au-Coated%20Ag%20alloy%20for%20IBGA%20automotive%20application.pdf
http://eprints.utem.edu.my/id/eprint/28007/
https://ieeexplore.ieee.org/document/10457870
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Institution: Universiti Teknikal Malaysia Melaka
Language: English
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spelling my.utem.eprints.280072024-10-17T08:18:54Z http://eprints.utem.edu.my/id/eprint/28007/ Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application Palagud, Jose Lim, T.S. Jasmee, Solehah Masdzarif, Nur Diana Izzani Wang, S.W. Hoo, K.I. Omar, Ghazali In semiconductor packaging, wire bonds have been an important interconnect, and over the years, the use of other wire bonds other than Gold (Au) such as Silver (Ag) and Copper (Cu) wires has started, driven by the lower cost offered. Unfortunately, these bonding wires cannot surpass the superior properties of Au wire bonds. Thus, Au coated Ag wire bond was seen as one of the emergences in wire bond technology which can provide similar properties with Au wires but in a lower cost. This study will provide a significant contribution to the use of Ag alloy in semiconductor industries as there are still limited studies of Au-coated Ag as bonding wires. The results show that the free air-ball (FAB) can be perfectly formed at higher Electronic Flame Off (EFO) current but have inconsistency when lower in EFO current setting. A higher EFO currents setting with lower EFO time is much preferred combination as predicted by design of experiment (DOE) CZ. The formed FAB also shows great bondability performance of Au-coated Ag with the inter-metallic compound (IMC) growth for the FAB is greater than 60%, which shows the positive effect of good diffusion and bonding. Second settings validation also showed that Au coated Ag alloy wire have positive response during small scale validation. Loop formation is also consistent and there were no wire related failures observe during the validation run. 2023 Conference or Workshop Item PeerReviewed text en http://eprints.utem.edu.my/id/eprint/28007/1/Analysis%20on%20bonding%20wires%20of%20Au-Coated%20Ag%20alloy%20for%20IBGA%20automotive%20application.pdf Palagud, Jose and Lim, T.S. and Jasmee, Solehah and Masdzarif, Nur Diana Izzani and Wang, S.W. and Hoo, K.I. and Omar, Ghazali (2023) Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application. In: 25th Electronics Packaging Technology Conference, EPTC 2023, 5 December 2023through 8 December 2023, Singapore. https://ieeexplore.ieee.org/document/10457870
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
description In semiconductor packaging, wire bonds have been an important interconnect, and over the years, the use of other wire bonds other than Gold (Au) such as Silver (Ag) and Copper (Cu) wires has started, driven by the lower cost offered. Unfortunately, these bonding wires cannot surpass the superior properties of Au wire bonds. Thus, Au coated Ag wire bond was seen as one of the emergences in wire bond technology which can provide similar properties with Au wires but in a lower cost. This study will provide a significant contribution to the use of Ag alloy in semiconductor industries as there are still limited studies of Au-coated Ag as bonding wires. The results show that the free air-ball (FAB) can be perfectly formed at higher Electronic Flame Off (EFO) current but have inconsistency when lower in EFO current setting. A higher EFO currents setting with lower EFO time is much preferred combination as predicted by design of experiment (DOE) CZ. The formed FAB also shows great bondability performance of Au-coated Ag with the inter-metallic compound (IMC) growth for the FAB is greater than 60%, which shows the positive effect of good diffusion and bonding. Second settings validation also showed that Au coated Ag alloy wire have positive response during small scale validation. Loop formation is also consistent and there were no wire related failures observe during the validation run.
format Conference or Workshop Item
author Palagud, Jose
Lim, T.S.
Jasmee, Solehah
Masdzarif, Nur Diana Izzani
Wang, S.W.
Hoo, K.I.
Omar, Ghazali
spellingShingle Palagud, Jose
Lim, T.S.
Jasmee, Solehah
Masdzarif, Nur Diana Izzani
Wang, S.W.
Hoo, K.I.
Omar, Ghazali
Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
author_facet Palagud, Jose
Lim, T.S.
Jasmee, Solehah
Masdzarif, Nur Diana Izzani
Wang, S.W.
Hoo, K.I.
Omar, Ghazali
author_sort Palagud, Jose
title Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
title_short Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
title_full Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
title_fullStr Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
title_full_unstemmed Analysis on bonding wires of Au-Coated Ag alloy for IBGA automotive application
title_sort analysis on bonding wires of au-coated ag alloy for ibga automotive application
publishDate 2023
url http://eprints.utem.edu.my/id/eprint/28007/1/Analysis%20on%20bonding%20wires%20of%20Au-Coated%20Ag%20alloy%20for%20IBGA%20automotive%20application.pdf
http://eprints.utem.edu.my/id/eprint/28007/
https://ieeexplore.ieee.org/document/10457870
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