Adaptive CUSUM location control charts based on score functions: An application in semiconductor wafer field

Adaptive CUSUM location control charts based on score functions: An application in semiconductor wafer field

An adaptive CUSUM (ACUSUM) control chart got special attention against classical CUSUM control chart to detect a shift of different sizes in the process location. Similarly, an ACUSUM based on classical EWMA statistic and score function, denoted as a ACUSUM E control chart, is improved form of class...

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Bibliographic Details
Main Authors: Zaman, Babar, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu’azu Ramat, Lee, Muhammad Hisyam
Format: Article
Language:English
Published: Springer Science and Business Media Deutschland GmbH 2022
Subjects:
QA Mathematics
Online Access:http://eprints.utm.my/id/eprint/101036/1/MuhammadHisyamLee2022_AdaptiveCUSUMLocationControlCharts.pdf
http://eprints.utm.my/id/eprint/101036/
http://dx.doi.org/10.1007/s13369-021-05878-z
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Institution: Universiti Teknologi Malaysia
Language: English

Internet

http://eprints.utm.my/id/eprint/101036/1/MuhammadHisyamLee2022_AdaptiveCUSUMLocationControlCharts.pdf
http://eprints.utm.my/id/eprint/101036/
http://dx.doi.org/10.1007/s13369-021-05878-z

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