Enhancing the performance of combined Shewhart-EWMA charts

by Abujiya, Mu’azu Ramat, Riaz, Muhammad, Lee, Muhammad Hisyam
Published 2012

Increasing the sensitivity of cumulative sum charts for location

by Abujiya, Mu'azu Ramat, Lee, Muhammad Hisyam, Riaz, Muhammad
Published 2015

Combined application of Shewhart and cumulative sum R chart for monitoring process dispersion

by Abujiya, Mu'Azu Ramat, Lee, Muhammad Hisyam, Riaz, Muhammad
Published 2016

Enhanced cumulative sum charts for monitoring process dispersion

by Abujiya, Mu'azu Ramat, Riaz, Muhammad, Lee, Muhammad Hisyam
Published 2015

New EWMA S-2 control charts for monitoring of process dispersion

by Abujiya, Mu’azu Ramat, Lee, Muhammad Hisyam, Riaz, Muhammad
Published 2017

Improving the performance of combined Shewhart-cumulative sum control charts

by Abujiya, Mu'azu Ramat, Riaz, Muhammad, Abdullah, Muhammad Hisyam Lee
Published 2013

On the sensitivity of poisson EWMA control chart

by Abujiya, Mu’azu Ramat, Farouk, Abbas Umar, Lee, Muhammad Hisyam, Mohamad, Ismail
Published 2013

An adaptive approach to EWMA dispersion chart using Huber and Tukey functions

by Zaman, Babar, Lee, Muhammad Hisyam, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu'azu Ramat
Published 2019

An adaptive EWMA chart with CUSUM accumulate error-based shift estimator for efficient process dispersion monitoring

by Zaman, Babar, Lee, Muhammad Hisyam, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu'azu Ramat
Published 2019

Adaptive CUSUM location control charts based on score functions: An application in semiconductor wafer field

by Zaman, Babar, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu’azu Ramat, Lee, Muhammad Hisyam
Published 2022

A robust multivariate Shewhart chart for contaminated normal environments

by Raji, Ishaq Adeyanju, Lee, Muhammad Hisyam, Riaz, Muhammad, Abujiya, Mu'azu Ramat, Abbas, Nasir
Published 2021

Outliers Detection Models in Shewhart Control Charts; an Application in photolithography: A semiconductor manufacturing industry

by Raji, Ishaq Adeyanju, Lee, Muhammad Hisyam, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu’azu Ramat, Abbas, Nasir
Published 2020

Outliers’ detection with a sensitive exponentially weighted moving average control chart

by Raji, Ishaq Adeyanju, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu'azu Ramat, Abbas, Nasir, Lee, Muhammad Hisyam
Published 2022

Adaptive memory control charts constructed on generalized likelihood ratio test to monitor process location

by Zaman, Babar, Lee, Muhammad Hisyam, Muhammad Riaz, Muhammad Riaz, Abujiya, Mu’azu Ramat, Mehmood, Rashid, Abbas, Nasir
Published 2022