Analytical study of carriers in silicon nanowires

The limitations on carrier (holes and electrons) drift due to high-field streamlining also randomly velocity vector in equilibrium is reported. Asymmetrical distribution function that converts randomness in zero-field to streamlined one in a very high electric field is employed. The ultimate drift v...

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Bibliographic Details
Main Authors: Ahmadi, Mohammad Taghi, Fallahpour, Amir Hossein, Allahdadian, Javad, Kouhnavard, Mojgan, Ismail, Razali
Format: Article
Published: 2009
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Online Access:http://eprints.utm.my/id/eprint/13682/
https://www.researchgate.net/publication/260835448_Analytical_Study_of_Carriers_in_Silicon_NanoWires
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Institution: Universiti Teknologi Malaysia
Description
Summary:The limitations on carrier (holes and electrons) drift due to high-field streamlining also randomly velocity vector in equilibrium is reported. Asymmetrical distribution function that converts randomness in zero-field to streamlined one in a very high electric field is employed. The ultimate drift velocity is found to be appropriate thermal velocity for a given dimensionality for non-degenerately doped nanostructure. However, the ultimate drift velocity is the Fermi velocity for degenerately doped nanostructures. Quantum and high-field effects controlling the transport of carrier in nanostructures are described. The results obtained are applied to the modeling of a nanowire transistor