Digital detection of gate leakage for analog CMOS circuit

RSM conference series has become the prominent international forum on semiconductor electronics embracing all aspects of the semiconductor technology from circuit device, modeling and simulation, photonics and sensor technology, MEMS technology, process and fabrication, packaging technology and manu...

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Bibliographic Details
Main Authors: Ibrahim, Muhammad Faisal, Kamisian, Izam, A'ain, Abu Khari, Lee, Yuen Tat, Terrence, Tan Huat Hin
Format: Conference or Workshop Item
Published: 2007
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Online Access:http://eprints.utm.my/id/eprint/13926/
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Institution: Universiti Teknologi Malaysia
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Summary:RSM conference series has become the prominent international forum on semiconductor electronics embracing all aspects of the semiconductor technology from circuit device, modeling and simulation, photonics and sensor technology, MEMS technology, process and fabrication, packaging technology and manufacturing, failure analysis and reliability, material and devices and nanoelectronics.