Determination of Worst Case Input Combinations of Nanoscale Circuits Using Bayesian Networks

Determination of Worst Case Input Combinations of Nanoscale Circuits Using Bayesian Networks

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Bibliographic Details
Main Authors: Narinderjit Singh A/L Sawaran Singh, Nor Hisham bin Hamid, Vijanth Sagayan A/L Asirvadam
Format: Citation Index Journal
Published: 2012
Online Access:http://eprints.utp.edu.my/9792/
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Institution: Universiti Teknologi Petronas

Internet

http://eprints.utp.edu.my/9792/

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