Biometrics and Identity Management

268 p.

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Bibliographic Details
Main Author: David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
Format: Book
Language:English
Published: Springer 2017
Subjects:
006
Online Access:http://repository.vnu.edu.vn/handle/VNU_123/26888
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Institution: Vietnam National University, Hanoi
Language: English
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spelling oai:112.137.131.14:VNU_123-268882020-07-14T05:38:21Z Biometrics and Identity Management David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli. Biometric identification 006 268 p. 2017-04-12T08:13:14Z 2017-04-12T08:13:14Z 2008 Book http://repository.vnu.edu.vn/handle/VNU_123/26888 en application/pdf Springer
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language English
topic Biometric identification
006
spellingShingle Biometric identification
006
David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
Biometrics and Identity Management
description 268 p.
format Book
author David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
author_facet David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
author_sort David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
title Biometrics and Identity Management
title_short Biometrics and Identity Management
title_full Biometrics and Identity Management
title_fullStr Biometrics and Identity Management
title_full_unstemmed Biometrics and Identity Management
title_sort biometrics and identity management
publisher Springer
publishDate 2017
url http://repository.vnu.edu.vn/handle/VNU_123/26888
_version_ 1680964187004600320