Biometrics and Identity Management

268 p.

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Bibliographic Details
Main Author: David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Ben Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli.
Format: Book
Language:English
Published: Springer 2017
Subjects:
006
Online Access:http://repository.vnu.edu.vn/handle/VNU_123/26888
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Institution: Vietnam National University, Hanoi
Language: English

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