Silver metallization : stability and reliability

• Main Authors: Adams, Daniel, Alford, Terry L., Mayer, James W.
• Format: Book
• Language: English
• Published: Springer 2017
• Subjects: Chemistry; Materials Science ; Silver > Electrometallurgy ; Electrochemical metallizing ; Integrated circuits > Materials.; 669.23
• Online Access: http://repository.vnu.edu.vn/handle/VNU_123/29863
• Institution: Vietnam National University, Hanoi

"Silver has the lowest resistivity of all metals, which makes it an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the thermal and electrical stability, a...